Built-in Self-test and Defect Tolerance in Molecular Electronics-based Nanofabrics
نویسندگان
چکیده
منابع مشابه
Built-in Self-test and Defect Tolerance in Molecular Electronics-based Nanofabrics
We propose a built-in self-test (BIST) procedure for nanofabrics implemented using chemically assembled electronic nanotechnology. Several fault detection configurations are presented to target stuck-at faults, shorts, opens, and connection faults in nanoblocks and switchblocks. The detectability of multiple faults in blocks within the nanofabric is also considered. We present an adaptive recov...
متن کاملBuilt-In Self-Test and Recovery Procedures for Molecular Electronics-Based Nanofabrics
In this paper, a built-in self-test (BIST) procedure is proposed for testing and fault tolerance of molecular electronicsbased nanofabrics. The nanofabrics are assumed to include up to 10 devices/cm; this requires new test strategies that can efficiently test and diagnose the nanofabrics in a reasonable time. Our BIST procedure utilizes nanofabric components as small test groups containing test...
متن کاملScalable Defect Tolerance for Molecular Electronics
Chemically assembled electronic nanotechnology (CAEN) is a promising alternative to CMOS-based computing. However, CAEN-based circuits are expected to have huge defect densities. To solve this problem CAEN can be used to build reconfigurable fabrics which, assuming the defects can be found, are inherently defect tolerant. In this paper, we propose a scalable testing methodology for finding defe...
متن کاملCombined Defect and Fault Tolerance for Reconfigurable Nanofabrics
Reconfigurable architectures represent a promising option for tolerating the extremely high defect and failure rates of emerging nanodevices. Different approaches have been devised throughout the years for coping with the occurrence of defects and faults in Field-Programmable Gate Arrays (FPGAs). However, due to the expected defect and fault rates, many of these methodologies cannot be directly...
متن کاملBuilt-In Self Test
BIST is a technique aimed to: Avoiding the usage of expensive ATE Increase the fault tolerance since it add more access to the internal points Allow the application of at-speed test and reduce the test time. It is mandatory to consider the BIST as a test solution when the design flow and the design area can afford it.
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ژورنال
عنوان ژورنال: Journal of Electronic Testing
سال: 2007
ISSN: 0923-8174,1573-0727
DOI: 10.1007/s10836-006-0550-z